
Semiconductor
test and automation
Wafer and flat panel large area static
and voltage measurement
High density wafer
probing
Chip failure analysis
Robotics and motion
control
Image processing
Target tracking, industrial
(bridge dynamics) and military
Advanced rauting algorithms
for FPGA’s and commercial
applications
Micromachining
Semiconductor pressure
sensing devices for medical and industrial application
Data
communication (ISDN, DLC)
SELECTED
ARTICLES:
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